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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">chemicallytech</journal-id><journal-title-group><journal-title xml:lang="en">Fine Chemical Technologies</journal-title><trans-title-group xml:lang="ru"><trans-title>Тонкие химические технологии</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2410-6593</issn><issn pub-type="epub">2686-7575</issn><publisher><publisher-name>MIREA – Russian Technological University (RTU MIREA).</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">chemicallytech-924</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>CHEMISTRY AND TECHNOLOGY OF INORGANIC MATERIALS</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ХИМИЯ И ТЕХНОЛОГИЯ НЕОРГАНИЧЕСКИХ МАТЕРИАЛОВ</subject></subj-group></article-categories><title-group><article-title>The study of morphology of heteroepytaxial structures on the basis of photosensitive layers CdXHg1-XTe by electron probe analysis methods</article-title><trans-title-group xml:lang="ru"><trans-title>Исследование морфологии гетероэпитаксиальных структур на основе фоточувствительного твердого раствора CdXHg1-XTe методами  электронно-зондового анализа</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Кашуба</surname><given-names>А. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Kashuba</surname><given-names>А. С.</given-names></name></name-alternatives><bio xml:lang="ru"><p>ведущий инженер-технолог</p></bio><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Заблоцкий</surname><given-names>А. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Zablotsky</surname><given-names>A. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>научный сотрудник</p></bio><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Коростылев</surname><given-names>Е. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Korostylev</surname><given-names>E. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>научный сотрудник</p></bio><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Кузин</surname><given-names>А. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Kuzin</surname><given-names>A. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>научный сотрудник</p></bio><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Пермикина</surname><given-names>Е. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Permikina</surname><given-names>E. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>кафедра Материалы микро-, опто- и наноэлектроники,  ведущий инженер</p></bio><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Арбенина</surname><given-names>В. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Arbenina</surname><given-names>V. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>кафедра Материалы микро-, опто- и наноэлектроники, доцент</p></bio><email xlink:type="simple">arbenina@mitht.ru</email><xref ref-type="aff" rid="aff-3"/></contrib></contrib-group><aff xml:lang="ru" id="aff-1"><institution>ФГУП «НПО «Орион»</institution><country>Russian Federation</country></aff><aff xml:lang="ru" id="aff-2"><institution>Московский физико-технический институт</institution><country>Russian Federation</country></aff><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>МИТХТ им. М.В. Ломоносова, 119571, Москва, пр-т Вернадского, д. 86</institution><country>Россия</country></aff><aff xml:lang="en"><institution>M.V. Lomonosov Moscow State University of Fine Chemical Technologies, 86, Vernadskogo pr., Moscow 119571</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2010</year></pub-date><pub-date pub-type="epub"><day>28</day><month>10</month><year>2010</year></pub-date><volume>5</volume><issue>5</issue><fpage>19</fpage><lpage>23</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Kashuba А.С., Zablotsky A.V., Korostylev E.V., Kuzin A.A., Permikina E.V., Arbenina V.V., 2010</copyright-statement><copyright-year>2010</copyright-year><copyright-holder xml:lang="ru">Кашуба А.С., Заблоцкий А.В., Коростылев Е.В., Кузин А.А., Пермикина Е.В., Арбенина В.В.</copyright-holder><copyright-holder xml:lang="en">Kashuba А.С., Zablotsky A.V., Korostylev E.V., Kuzin A.A., Permikina E.V., Arbenina V.V.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.finechem-mirea.ru/jour/article/view/924">https://www.finechem-mirea.ru/jour/article/view/924</self-uri><abstract/><trans-abstract xml:lang="ru"/><kwd-group xml:lang="ru"><kwd>твердый раствор теллурида кадмия-ртути CdXHg1-XTe (КРТ)</kwd><kwd>молекулярно-лучевая эпитаксия (МЛЭ)</kwd><kwd>V−дефекты</kwd><kwd>эпитаксиальный слой (ЭС)</kwd><kwd>гетероструктура (ГС)</kwd><kwd>растровая электронная микроскопия (РЭМ)</kwd><kwd>электронно-зондовый рентгеновский микроанализ (РМА)</kwd></kwd-group><kwd-group xml:lang="en"><kwd>solid solution cadmium telluride - mercury telluride CXHg1-XTe</kwd><kwd>molecular beam epitaxy (МBE)</kwd><kwd>V-defects</kwd><kwd>epitaxial layer</kwd><kwd>heterostructure</kwd><kwd>scanning electronic microscopy (SEM)</kwd><kwd>electronic probe x-ray microanalysis (EPMA)</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Исследование состояния поверхности CdTe / А. К. Гутаковский [и др.] // Поверхность. - 1988. - № 9. - C. 80-88.</mixed-citation><mixed-citation xml:lang="en">Исследование состояния поверхности CdTe / А. К. Гутаковский [и др.] // Поверхность. - 1988. - № 9. - C. 80-88.</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">Defect formation during growth of CdTe(111) and HgCdTe films by molecular beam epitaxy / I. V. Sabinina [et al.] // J. Cryst. Growth. - 1992. - Vol. 117, № 1-4. - P. 238-243.</mixed-citation><mixed-citation xml:lang="en">Defect formation during growth of CdTe(111) and HgCdTe films by molecular beam epitaxy / I. V. Sabinina [et al.] // J. Cryst. Growth. - 1992. - Vol. 117, № 1-4. - P. 238-243.</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">Defect formation during MBE growth of CdTe(111) / I. V. Sabinina [et al.] // Phys. stat. sol. (a). - 1991. - Vol. 126. - P. 181-188.</mixed-citation><mixed-citation xml:lang="en">Defect formation during MBE growth of CdTe(111) / I. V. Sabinina [et al.] // Phys. stat. sol. (a). - 1991. - Vol. 126. - P. 181-188.</mixed-citation></citation-alternatives></ref><ref id="cit4"><label>4</label><citation-alternatives><mixed-citation xml:lang="ru">Фотолюминесценция пленок (111)CdTe, выращенных на (100) GaAs методом молекулярно-лучевой эпитаксии / Е. А. Милохин [и др.] // Физика твердого тела. - 1991. - T. 33. - C. 1155-1160.</mixed-citation><mixed-citation xml:lang="en">Фотолюминесценция пленок (111)CdTe, выращенных на (100) GaAs методом молекулярно-лучевой эпитаксии / Е. А. Милохин [и др.] // Физика твердого тела. - 1991. - T. 33. - C. 1155-1160.</mixed-citation></citation-alternatives></ref><ref id="cit5"><label>5</label><citation-alternatives><mixed-citation xml:lang="ru">Sabinina, I. V. Preparation of TEM samples from compound semiconductors by chemomechanical polishing / I. V. Sabinina, A. K. Gutakovsky // Ultramicroscopy. - 1992. - Vol. 45. - P. 411-415.</mixed-citation><mixed-citation xml:lang="en">Sabinina, I. V. Preparation of TEM samples from compound semiconductors by chemomechanical polishing / I. V. Sabinina, A. K. Gutakovsky // Ultramicroscopy. - 1992. - Vol. 45. - P. 411-415.</mixed-citation></citation-alternatives></ref><ref id="cit6"><label>6</label><citation-alternatives><mixed-citation xml:lang="ru">Twinning in CdTe (111) films on (100) GaAs substrates / S. A. Dvoretsky [et al // Inst. Phys. Conf. Ser. - 1988. - Vol. 2, № 93. - P. 407-408.</mixed-citation><mixed-citation xml:lang="en">Twinning in CdTe (111) films on (100) GaAs substrates / S. A. Dvoretsky [et al // Inst. Phys. Conf. Ser. - 1988. - Vol. 2, № 93. - P. 407-408.</mixed-citation></citation-alternatives></ref><ref id="cit7"><label>7</label><citation-alternatives><mixed-citation xml:lang="ru">Двойникование в пленках CdTe (111) на подложках GaAs(100) / В. И. Бударных [и др.] // Доклады АН. - 1989. - T. 304, № 3. - C. 604-607.</mixed-citation><mixed-citation xml:lang="en">Двойникование в пленках CdTe (111) на подложках GaAs(100) / В. И. Бударных [и др.] // Доклады АН. - 1989. - T. 304, № 3. - C. 604-607.</mixed-citation></citation-alternatives></ref><ref id="cit8"><label>8</label><citation-alternatives><mixed-citation xml:lang="ru">Melt Growth of CdTe Crystals and Transmission Electron Microscopic Investigation of their Grain Boundaries / I. V. Sabinina [et al.] // Cryst. Res. Technol. - 1991. - Vol. 26, № 8. - P. 967-972.</mixed-citation><mixed-citation xml:lang="en">Melt Growth of CdTe Crystals and Transmission Electron Microscopic Investigation of their Grain Boundaries / I. V. Sabinina [et al.] // Cryst. Res. Technol. - 1991. - Vol. 26, № 8. - P. 967-972.</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
