<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">chemicallytech</journal-id><journal-title-group><journal-title xml:lang="en">Fine Chemical Technologies</journal-title><trans-title-group xml:lang="ru"><trans-title>Тонкие химические технологии</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2410-6593</issn><issn pub-type="epub">2686-7575</issn><publisher><publisher-name>MIREA – Russian Technological University (RTU MIREA).</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32362/2410-6593-2017-12-1-5-25</article-id><article-id custom-type="elpub" pub-id-type="custom">chemicallytech-68</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>CHEMISTRY AND TECHNOLOGY OF INORGANIC MATERIALS</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ХИМИЯ И ТЕХНОЛОГИЯ НЕОРГАНИЧЕСКИХ МАТЕРИАЛОВ</subject></subj-group></article-categories><title-group><article-title>ULTRAFAST TRANSMISSION ELECTRON MICROSCOPY</article-title><trans-title-group xml:lang="ru"><trans-title>СВЕРХБЫСТРАЯ ПРОСВЕЧИВАЮЩАЯ ЭЛЕКТРОННАЯ МИКРОСКОПИЯ</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ищенко</surname><given-names>А. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Ischenko</surname><given-names>A. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>заведующий кафедрой</p><p>Москва, 119571 Россия</p></bio><bio xml:lang="en"><p>Moscow, 119571 Russia</p></bio><email xlink:type="simple">aischenko@yasenevo.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Тарасов</surname><given-names>Ю. И.</given-names></name><name name-style="western" xml:lang="en"><surname>Tarasov</surname><given-names>Yu. I.</given-names></name></name-alternatives><bio xml:lang="ru"><p>заведующий кафедрой</p><p>Москва, 119571 Россия</p></bio><bio xml:lang="en"><p>Moscow, 119571 Russia</p></bio><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Рябов</surname><given-names>Е. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Ryabov</surname><given-names>E. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>заведующий отделом лазерной спектроскопии</p><p>Москва, Троицк,108840 Россия</p></bio><bio xml:lang="en"><p>Moscow, Troitsk, 108840 Russia</p></bio><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Асеев</surname><given-names>С. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Aseyev</surname><given-names>S. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>ведущий научный сотрудник лаборатории спектроскопии ультрабыстрых процессов</p><p>Москва, Троицк,108840 Россия</p></bio><bio xml:lang="en"><p>Moscow, Troitsk, 108840 Russia</p></bio><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Шефер</surname><given-names>Л.</given-names></name><name name-style="western" xml:lang="en"><surname>Schäfer</surname><given-names>L.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Фэйтвилл, 72701, Арканзас, США</p></bio><bio xml:lang="en"><p>Fayetteville, AR, U.S.A., AR72701</p></bio><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-3"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Московский технологический университет (Институт тонких химических технологий)</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Moscow Technological University (Institute of Fine Chemical Technologies)</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Институт спектроскопии РАН</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Institute of Spectroscopy of the RAS</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>Университет штата Арканзас</institution><country>Соединённые Штаты Америки</country></aff><aff xml:lang="en"><institution>University of Arkansas</institution><country>United States</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2017</year></pub-date><pub-date pub-type="epub"><day>28</day><month>02</month><year>2017</year></pub-date><volume>12</volume><issue>1</issue><fpage>5</fpage><lpage>25</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Ischenko A.A., Tarasov Y.I., Ryabov E.A., Aseyev S.A., Schäfer L., 2017</copyright-statement><copyright-year>2017</copyright-year><copyright-holder xml:lang="ru">Ищенко А.А., Тарасов Ю.И., Рябов Е.А., Асеев С.А., Шефер Л.</copyright-holder><copyright-holder xml:lang="en">Ischenko A.A., Tarasov Y.I., Ryabov E.A., Aseyev S.A., Schäfer L.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.finechem-mirea.ru/jour/article/view/68">https://www.finechem-mirea.ru/jour/article/view/68</self-uri><abstract><p>Ultrafast laser spectral and electron diffraction methods complement each other and open up new possibilities in chemistry and physics to light up atomic and molecular motions involved in the primary processes governing structural transitions. Since the 1980s, scientific laboratories in the world have begun to develop a new field of research aimed at this goal. “Atomic-molecular movies” will allow visualizing coherent dynamics of nuclei in molecules and fast processes in chemical reactions in real time. Modern femtosecond and picosecond laser sources have made it possible to significantly change the traditional approaches using continuous electron beams, to create ultrabright pulsed photoelectron sources, to catch ultrafast processes in the matter initiated by ultrashort laser pulses and to achieve high spatio-temporal resolution in research. There are several research laboratories all over the world experimenting or planning to experiment with ultrafast electron diffraction and possessing electron microscopes adapted to operate with ultrashort electron beams. It should be emphasized that creating a new-generation electron microscope is of crucial importance, because successful realization of this project demonstrates the potential of leading national research centers and their ability to work at the forefront of modern science.</p></abstract><trans-abstract xml:lang="ru"><p>Методы сверхбыстрой электронной дифракции, лазерной спектроскопии и квантовой химии, дополняя друг друга, открывают новые возможности изучения внутримолекулярной динамики веществ, участвующих в процессах химических реакций. Переходное состояние химических реакций определяет направление этих процессов. Начиная от первых работ 1980-х годов, выполненных в России и показавших принципиальную возможность исследования когерентной динамики ядер молекулярных систем, многие научные лаборатории в мире начали интенсивную разработку новой области исследований, направленную на экспериментальное исследование переходного состояния методом сверхбыстрой дифракции электронов. Последовательное развитие этого направления привело к созданию так называемого “атомно-молекулярного кино”, позволяющего визуализировать когерентную динамику ядер в молекулах и сверхбыстрые процессы в химических реакциях в режиме реального времени. В настоящее время ряд научно-исследовательских лабораторий в мире разрабатывают методы сверхбыстрой дифракции электронов и рентгеновского излучения, которые открыли возможность исследования переходного состояния химических реакций. Создание электронных микроскопов с высоким пространственно-временным разрешением является новым направлением в электронной микроскопии, близко примыкающим к этому новому направлению науки. Успешная реализация этого направления исследований демонстрирует потенциал ведущих национальных научно-исследовательских центров и их способность работать на переднем крае современной науки.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>сверхбыстрая дифракция электронов и рентгеновского излучения</kwd><kwd>кристаллография и электронная микроскопия</kwd><kwd>ультракороткие лазерные импульсы</kwd><kwd>фемтосекундные и пикосекундные импульсные электронные пучки</kwd><kwd>сверхбыстрое фотовозбуждение молекул</kwd><kwd>когерентная динамика ядер</kwd><kwd>когерентная динамика электронов</kwd><kwd>динамика фазовых переходов</kwd></kwd-group><kwd-group xml:lang="en"><kwd>ultrafast electron diffraction</kwd><kwd>crystallography and microscopy</kwd><kwd>ultrashort laser pulses</kwd><kwd>femtosecond and picosecond pulsed electron beams</kwd><kwd>ultrafast photoexcitation of molecules</kwd><kwd>coherent dynamics of nuclei</kwd><kwd>coherent electron dynamics</kwd><kwd>dynamics of phase transitions</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Hawkes P.W., Kasper E. 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