chemicallytechFine Chemical TechnologiesТонкие химические технологии2410-65932686-7575MIREA – Russian Technological University (RTU MIREA).10.32362/2410-6593-2023-18-2-135-167chemicallytech-1955Research ArticleANALYTICAL METHODS IN CHEMISTRY AND CHEMICAL TECHNOLOGYАНАЛИТИЧЕСКИЕ МЕТОДЫ В ХИМИИ И ХИМИЧЕСКОЙ ТЕХНОЛОГИИAnalysis of nanoparticles and nanomaterials using X-ray photoelectron spectroscopyАнализ наночастиц и наноматериалов методом рентгеновской фотоэлектронной спектроскопииhttps://orcid.org/0000-0003-1532-377XИщенкоА. А.IschenkoA. A.

Ищенко Анатолий Александрович – доктор химических наук, профессор, заведующий кафедрой аналитической химии им. И.П. Алимарина.

119571, Москва, пр-т Вернадского, д. 86

Scopus Author ID 6701507307, ResearcherID B-2767-2014

Anatoly A. Ischenko - Dr. Sci. (Chem.), Professor, Head of the I.P. Alimarin Department of Analytical Chemistry, M.V. Lomonosov Institute of Fine Chemical Technologies, MIREA - Russian Technological University.

86, Vernadskogo pr., Moscow, 119571

Scopus Author ID 6701507307, ResearcherID B-2767-2014

aischenko@yasenevo.ruhttps://orcid.org/0000-0001-8578-1683ЛазовМ. А.LazovM. A.

Лазов Михаил Александрович – кандидат химических наук, ассистент кафедры аналитической химии им. И.П. Алимарина.

119571, Москва, пр-т Вернадского, д. 86

Scopus Author ID 56466030700

Mikhail A. Lazov - Cand. Sci. (Chem.), Assistant Professor, I.P. Alimarin Department of Analytical Chemistry, M.V. Lomonosov Institute of Fine Chemical Technologies, MIREA - Russian Technological University.

86, Vernadskogo pr., Moscow, 119571

Scopus Author ID 56466030700

lazovm@gmail.comhttps://orcid.org/0000-0001-8213-7059МироноваЕ. В.MironovaE. V.

Миронова Елена Валерьевна - старший преподаватель кафедры аналитической химии им. И.П. Алимарина.

119571, Москва, пр-т Вернадского, д. 86

Elena V. Mironova - Senior Lecturer, I.P. Alimarin Department of Analytical Chemistry, M.V. Lomonosov Institute of Fine Chemical Technologies, MIREA - Russian Technological University.

86, Vernadskogo pr., Moscow, 119571

mironova.ev.mitht@yandex.ruhttps://orcid.org/0000-0003-1333-7318ПутинА. Ю.PutinA. Yu.

Путин Алексей Юрьевич – кандидат химических наук, доцент кафедры общей химической технологии.

119571, Москва, пр-т Вернадского, д. 86

Alexey Yu. Putin - Cand. Sci. (Chem.), Assistant Professor, Department of General Chemical Technology, M.V. Lomonosov Institute of Fine Chemical Technologies, MIREA - Russian Technological University.

86, Vernadskogo pr., Moscow, 119571

putin@mirea.ruhttps://orcid.org/0000-0002-2094-1065ИоновА. М.IonovA. M.

Ионов Андрей Михайлович – доктор физико-математических наук, профессор, ведущий научный сотрудник.

142432, Московская обл., Черноголовка, ул. Академика Осипьяна, д. 2

Andrey M. Ionov - Dr. Sci. (Phys.-Math.), Professor, Leading Researcher, Osipyan Institute of Solid State Physics, Russian Academy of Sciences.

2, Akademika Osip'yana ul., Chernogolovka, Moscow oblast, 142432

ionov@issp.ac.ruСтороженкоП. А.StorozhenkoP. A.

Стороженко Павел Аркадьевич - академик РАН, доктор химических наук, профессор, научный руководитель ГНЦ РФ АО «ГНИИХТЭОС».

111123, Москва, шоссе Энтузиастов, д. 38

Scopus Author ID 9633186700, ResearcherID D-4645-214

Pavel A. Storozhenko - Academician at the Russian Academy of Sciences, Dr. Sci. (Chem.), Professor, Scientific Director of State Scientific Research Institute of Chemistry and Technology of Organoelement Compounds.

38, Entuziastov shosse, Moscow, 111123

Scopus Author ID 9633186700, ResearcherID D-4645-214

bigpastor@mail.ruИнститут тонких химических технологий им. М.В. Ломоносова ФГБОУ ВО «МИРЭА - Российский технологический университет»РоссияM.V. Lomonosov Institute of Fine Chemical Technologies, MIREA - Russian Technological UniversityRussian FederationИнститут физики твердого тела, Российская академия наукРоссияInstitute of Solid State Physics, Russian Academy of SciencesRussian FederationГосударственный научный центр Российской Федерации АО “ГНИИХТЭОС”РоссияGNIIKHTEOSRussian Federation202327052023182135167Copyright © Ischenko A.A., Lazov M.A., Mironova E.V., Putin A.Y., Ionov A.M., Storozhenko P.A., 20232023Ищенко А.А., Лазов М.А., Миронова Е.В., Путин А.Ю., Ионов А.М., Стороженко П.А.Ischenko A.A., Lazov M.A., Mironova E.V., Putin A.Y., Ionov A.M., Storozhenko P.A.This work is licensed under a Creative Commons Attribution 4.0 License.https://www.finechem-mirea.ru/jour/article/view/1955Objectives

Objectives. The main aim of this review is to summarize the existing knowledge on the use of X-ray photoelectron spectroscopy (XPS) for the characterization of nanoparticles and nanomaterials.

Results

Results. XPS or electron spectroscopy for chemical analysis can provide information on the qualitative and quantitative composition, valence states of the elements of the samples under study, the chemical composition of the surface and interfaces that determine the properties of nanoparticles and nanostructured materials. The review describes the role of several different methods for the characterization of nanomaterials, highlights their advantages and limitations, and the possibilities of an effective combination. The main characteristics of XPS are described. Various examples of its use for the analysis of nanoparticles and nanomaterials are given in conjunction with additional methods to obtain complementary information about the object under study.

Conclusions

Conclusions. XPS provides depth information comparable to the size of nanoparticles (up to 10 nm depth from the surface) and does not cause significant damage to the samples. Two disadvantages of XPS analysis are sample preparation requiring a dry solid form without contaminations and data interpretation. XPS provides information not only on the chemical identity, but also on the dielectric properties of nanomaterials, recording their charging/discharging behavior. Chemical information from the surface of nanoparticles analyzed by XPS can be used to estimate the thickness of nanoparticle coatings. XPS has a high selectivity, since the resolution of the method makes it possible to distinguish a characteristic set of lines in the photoelectron spectrum at kinetic energies determined by the photon energy and the corresponding binding energies in elements. The intensity of the lines depends on the concentration of the respective element. Obtaining a sufficiently complete picture of the properties of nanomaterials requires the use of a group of complementary instrumental methods of analysis.

Цели

Цели. Основная цель данного обзора - обобщить существующие знания об использовании метода рентгеновской фотоэлектронной спектроскопии (РФЭС) для характеризации наночастиц и наноматериалов.

Результаты

Результаты. Метод РФЭС или электронной спектроскопии для химического анализа может предоставить информацию о качественном и количественном составе, валентных состояниях элементов исследуемых образцов, химическом составе поверхности и границ раздела, которые определяют свойства наночастиц и наноструктурных материалов. В обзоре описана роль нескольких различных методов для характеристики наноразмерных материалов, подчеркнуты их преимущества, ограничения и возможности эффективной комбинации. Описаны основные характеристики РФЭС. Приведены различные примеры ее использования для анализа наночастиц и наноматериалов в совокупности с дополнительными методами для получения комплементарной информации об изучаемом объекте.

Выводы

Выводы. РФЭС предоставляет информацию о глубине, сравнимой с размером наночастиц (до 10 нм глубины от поверхности), и не вызывает значительного повреждения образцов. Двумя недостатками анализа РФЭС являются подготовка образцов (требуется сухая твердая форма без загрязнения) и интерпретация данных. РФЭС предоставляет информацию не только о химической идентичности, но и о диэлектрических свойствах наноматериалов, регистрируя их поведение при зарядке/разрядке. Химическая информация с поверхности наночастиц, проанализированная с помощью РФЭС, может использоваться для оценки толщины покрытий наночастиц. РФЭС обладает высокой селективностью, поскольку разрешающая способность метода позволяет различить характерный набор линий в фотоэлектронном спектре при кинетических энергиях, определяемых энергией фотонов и соответствующими энергиями связи в элементах. Интенсивность линий зависит от концентрации соответствующего элемента. Получение достаточно полной картины свойств наноматериалов требует использования группы взаимодополняющих инструментальных методов анализа.

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The authors declare that there are no conflicts of interest present.